Minimum load cell verification interval (Vmin)
Sensitivity (Cn)
Zero balance
Temperature effect on sensitivity(TKc)
Temperature effect on zero balance (TKo)
Non-linearity (dlin) *
Repeatability (drep) *
Hysteresis error (dhy) *
Creep (dDR)in 30 min
Input resistance (RLC) [Red(+)-black(-)]
Output resistance (RO) [Green(+)-White(-)]
Reference excitation voltage (Uref)
Maximal excitation voltage
Insulation resistance (Ris)
Nominal temperature range
Service temperature range
Storage temperature range |
% of Cn
mV/V
mV/V
% of Cn/k
% of Cn/k
%
%
%
%
O
O
V(DC/AC)
V(DC/AC)
GO
oC [ o F]
oC [ o F]
oC [ o F] |
0.1
2.5±10%
±0.05
< ±0.0046
< ±0.016
< ±0.32
< ±0.050
< ±0.32
< ±0.100
400 ±25
350±3
0.5.12
18
>2[50 VDC ]
-10.+40[15.+105]
-30.+70[-20.+160]
-50.+85[-60.+185] |